Here is a summary and extract of MIL-HDBK-338B, the U.S. Army Reliability Design Manual to provide some support for FTA. Here is an introduction in the following way:
If we want to perform a quantitative analysis of FTA, we must complete the reliability prediction first. Before reliability, we must perform preliminary calculations on the voltage distribution table and temperature distribution. Through the following table, we can probably predict failures. The following figures are for reference only. The MIL-HDBK-338B itself is a guide book, and all figures are only for reference.
Distribution of capacitor failure modes: Most of the capacitors fail in the form of short circuits, especially tantalum capacitors, which should be paid special attention.
Resistance: The resistance is mainly an open circuit, the mixture resistance is generally a discrete resistance, and the thin film resistance is an SMD surface mount resistance.
Relays, coils, transformers:
Diode: Mainly short circuit.
Triode and Mos tube: The triode is similar to JFET, but completely different from MosFET.
Battery:
Other components:
